In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic–inorganic interface. The C 1s core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule–substrate interaction. XAS at the Cu L3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40Å CuPc film the molecular plane was found to be almost perpendicular to the substrate surface.

Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation / A., Ruocco; F., Evangelista; A., Attili; Donzello, Maria Pia; Betti, Maria Grazia; L., Giovanelli; R., Gotter. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - STAMPA. - 137:(2004), pp. 165-169. [10.1016/j.elspec.2004.02.092]

Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation

DONZELLO, Maria Pia;BETTI, Maria Grazia;
2004

Abstract

In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic–inorganic interface. The C 1s core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule–substrate interaction. XAS at the Cu L3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40Å CuPc film the molecular plane was found to be almost perpendicular to the substrate surface.
2004
01 Pubblicazione su rivista::01a Articolo in rivista
Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation / A., Ruocco; F., Evangelista; A., Attili; Donzello, Maria Pia; Betti, Maria Grazia; L., Giovanelli; R., Gotter. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - STAMPA. - 137:(2004), pp. 165-169. [10.1016/j.elspec.2004.02.092]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/234795
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