The total geometrical efficiency, solid angle contribution and gradient were estimated theoretically for a sample placed in a triaxial system equipped with a fluorescent source and x-ray tube. The contribution of all of the above parameters were assessed at two different secondary target angles with distance. These values are useful for the triaxial system to measure the basic interaction cross-sections excited by keV photons, to enhance the Compton scattered photons, estimation of monochromacy, solid angle correction and geometrical efficiency. Initially, the secondary target and sample are located at an angle of 45degrees and detected the scattered radiation from the sample to enhance the Compton scattered photons. By placing the sample at 90degrees in a triaxial system, the contribution of background is estimated. Comparing the data obtained in the two modes, the Compton photons are enhanced. An analysis of the above parameters and their importance for various potential applications are thoroughly discussed.
Geometrical efficiency, solid angle contribution and gradient for a triaxial system equipped with fluorescent source and X-ray tube: An analysis to enhance the Compton scattered photons / Rao, D. V.; G., Gigante; Brunetti, A.; Gigante, Giovanni Ettore; Takeda, T.; Itai, Y.; Akatsuka, T.. - In: X-RAY SPECTROMETRY. - ISSN 0049-8246. - STAMPA. - 33:2(2004), pp. 87-100. [10.1002/xrs.665]
Geometrical efficiency, solid angle contribution and gradient for a triaxial system equipped with fluorescent source and X-ray tube: An analysis to enhance the Compton scattered photons.
GIGANTE, Giovanni Ettore;
2004
Abstract
The total geometrical efficiency, solid angle contribution and gradient were estimated theoretically for a sample placed in a triaxial system equipped with a fluorescent source and x-ray tube. The contribution of all of the above parameters were assessed at two different secondary target angles with distance. These values are useful for the triaxial system to measure the basic interaction cross-sections excited by keV photons, to enhance the Compton scattered photons, estimation of monochromacy, solid angle correction and geometrical efficiency. Initially, the secondary target and sample are located at an angle of 45degrees and detected the scattered radiation from the sample to enhance the Compton scattered photons. By placing the sample at 90degrees in a triaxial system, the contribution of background is estimated. Comparing the data obtained in the two modes, the Compton photons are enhanced. An analysis of the above parameters and their importance for various potential applications are thoroughly discussed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.