The structural and chemical characterization of the TiC/rutile interface that grows in the high-temperature and low-oxygen partial pressure oxidation of TiC single crystals is reported. Based on previous data of micro-Raman and Auger electron spectroscopy (AES)-scanning electron microscopy (SEM) profiles of the TiC/rutile interface cross-section, a Ti oxycarbide phase is expected to form at the TiC/rutile interface. In order to be consistent with the above mentioned data, Ti oxycarbide should form by partial substitution of C with O without producing any change in the rock-salt structure of TiC except to small changes in the lattice parameter. Following the Ti oxycarbide e-gun synthesis by X-ray diffraction (XRD) analysis, the enhancement of the O substitution in the C sublattice of TiC has been shown. The final product has been identified by chemical analysis as Ti1.00±0.01C 0.49±0.01O0.4±0.1 having a XRD spectrum almost identical to TiC with a relative change of the lattice parameter equal to -0.8%. This result confirms the reason why no other signals other than the signals of amorphous carbon and rutile appear in the micro-Raman profiles of the TiC/TiO2 interface as well as the reliability of the oxidation mechanism elsewhere proposed. © 2004 Elsevier B.V. All rights reserved.
Overview of the TiC/TiO2 (rutile) interface / A., Bellucci; Gozzi, Daniele; Latini, Alessandro. - In: SOLID STATE IONICS. - ISSN 0167-2738. - STAMPA. - 172:1-4 SPEC. ISS.(2004), pp. 369-375. [10.1016/j.ssi.2004.02.055]
Overview of the TiC/TiO2 (rutile) interface
GOZZI, Daniele;LATINI, ALESSANDRO
2004
Abstract
The structural and chemical characterization of the TiC/rutile interface that grows in the high-temperature and low-oxygen partial pressure oxidation of TiC single crystals is reported. Based on previous data of micro-Raman and Auger electron spectroscopy (AES)-scanning electron microscopy (SEM) profiles of the TiC/rutile interface cross-section, a Ti oxycarbide phase is expected to form at the TiC/rutile interface. In order to be consistent with the above mentioned data, Ti oxycarbide should form by partial substitution of C with O without producing any change in the rock-salt structure of TiC except to small changes in the lattice parameter. Following the Ti oxycarbide e-gun synthesis by X-ray diffraction (XRD) analysis, the enhancement of the O substitution in the C sublattice of TiC has been shown. The final product has been identified by chemical analysis as Ti1.00±0.01C 0.49±0.01O0.4±0.1 having a XRD spectrum almost identical to TiC with a relative change of the lattice parameter equal to -0.8%. This result confirms the reason why no other signals other than the signals of amorphous carbon and rutile appear in the micro-Raman profiles of the TiC/TiO2 interface as well as the reliability of the oxidation mechanism elsewhere proposed. © 2004 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.