We study the nonlinear refraction of X-rays in highly ionized condensed matter by using a classical model of a cold electron plasma in a lattice of still ions coupled with Maxwell equations. We discuss the existence and stability of nonlinear waves. As a real-world example, we consider beam self-defocusing in crystalline materials (B, C, Li, Na). We predict that nonlinear processes become comparable to the linear ones for focused beams with powers of the order of mc(3)/r(o) (approximate to 10 GW), the classical electron power. As a consequence, nonlinear phenomena are expected in currently exploited X-ray Free-Electron Lasers and in their future developments. (C) 2008 Optical Society of America.

Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects / Conti, Claudio; A., Fratalocchi; Ruocco, Giancarlo; F., Sette. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 16:12(2008), pp. 8324-8331. [10.1364/oe.16.008324]

Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects

CONTI, CLAUDIO;RUOCCO, Giancarlo;
2008

Abstract

We study the nonlinear refraction of X-rays in highly ionized condensed matter by using a classical model of a cold electron plasma in a lattice of still ions coupled with Maxwell equations. We discuss the existence and stability of nonlinear waves. As a real-world example, we consider beam self-defocusing in crystalline materials (B, C, Li, Na). We predict that nonlinear processes become comparable to the linear ones for focused beams with powers of the order of mc(3)/r(o) (approximate to 10 GW), the classical electron power. As a consequence, nonlinear phenomena are expected in currently exploited X-ray Free-Electron Lasers and in their future developments. (C) 2008 Optical Society of America.
2008
nonlinear optics; nonlinear waves; x-ray
01 Pubblicazione su rivista::01a Articolo in rivista
Nonlinear optics in the X-ray regime: nonlinear waves and self-action effects / Conti, Claudio; A., Fratalocchi; Ruocco, Giancarlo; F., Sette. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 16:12(2008), pp. 8324-8331. [10.1364/oe.16.008324]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/229775
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