The effects of conducting loads on the shielding effectiveness of rectangular metallic enclosures is investigated through an efficient formulation based on the method of moments. As expected, the analysis shows that the classical shielding effectiveness is a very tricky figure of merit which is seriously affected by the possible presence of loads inside the enclosure, especially in the frequency range above the first resonant frequency of the enclosure. Comparisons with rigorous fall-wave results obtained through commercial software confirm the validity of the proposed technique and its high efficiency.

Efficient computation of the shielding effectiveness of metallic enclosures loaded with conductors / Araneo, Rodolfo; Lovat, Giampiero. - ELETTRONICO. - (2008), pp. 280-285. (Intervento presentato al convegno 2008 IEEE EMC-S International Symposium on Electromagnetic Compatibility tenutosi a Detroit, MI nel 18-22 August 2008) [10.1109/ISEMC.2008.4652053].

Efficient computation of the shielding effectiveness of metallic enclosures loaded with conductors

ARANEO, Rodolfo;LOVAT, GIAMPIERO
2008

Abstract

The effects of conducting loads on the shielding effectiveness of rectangular metallic enclosures is investigated through an efficient formulation based on the method of moments. As expected, the analysis shows that the classical shielding effectiveness is a very tricky figure of merit which is seriously affected by the possible presence of loads inside the enclosure, especially in the frequency range above the first resonant frequency of the enclosure. Comparisons with rigorous fall-wave results obtained through commercial software confirm the validity of the proposed technique and its high efficiency.
2008
2008 IEEE EMC-S International Symposium on Electromagnetic Compatibility
Apertures; enclosures; shielding effectiveness
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Efficient computation of the shielding effectiveness of metallic enclosures loaded with conductors / Araneo, Rodolfo; Lovat, Giampiero. - ELETTRONICO. - (2008), pp. 280-285. (Intervento presentato al convegno 2008 IEEE EMC-S International Symposium on Electromagnetic Compatibility tenutosi a Detroit, MI nel 18-22 August 2008) [10.1109/ISEMC.2008.4652053].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/226631
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