The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications.
Fast Calculation of Dielectric Substrate Losses in Microwave Applications by the FD2TD Method Using a New Formalism / C., Buccella; V., DE SANTIS; M., Feliziani; Maradei, Francescaromana. - ELETTRONICO. - (2010), pp. 253-256. (Intervento presentato al convegno IEEE 2010 International Symposium on Electromagnetic Compatibility tenutosi a Fort Lauderdale (FL), USA nel July 26-30, 2010) [10.1109/ISEMC.2010.5711280].
Fast Calculation of Dielectric Substrate Losses in Microwave Applications by the FD2TD Method Using a New Formalism
MARADEI, Francescaromana
2010
Abstract
The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
