The paper deals with a full-wave investigation of the capacitive coupling clamp that is used in electrical fast transient (EFT) immunity test to inject disturbances to nominal signals. The analysis is performed by using the software tool MicroWave Studio (MWS) based on the finite integration technique. The model of the injection clamp is validated by comparison with measurements and with the results obtained by SPICE. The full-wave model is used to investigate EFT injection clamp calibration setup, such as that proposed in section "6.4.2 Calibration of the capacitive coupling clamp" of the IEC 61000-4-4 new Edition (i.e., the 3rd). ©2010 IEEE.

Full-wave investigation of EFT injection clamp calibration setup / Spartaco, Caniggia; Eric, Dudenhoeffer; Maradei, Francescaromana. - ELETTRONICO. - (2010), pp. 602-607. (Intervento presentato al convegno 2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 tenutosi a Fort Lauderdale, FL nel 25 July 2010 through 30 July 2010) [10.1109/isemc.2010.5711345].

Full-wave investigation of EFT injection clamp calibration setup

MARADEI, Francescaromana
2010

Abstract

The paper deals with a full-wave investigation of the capacitive coupling clamp that is used in electrical fast transient (EFT) immunity test to inject disturbances to nominal signals. The analysis is performed by using the software tool MicroWave Studio (MWS) based on the finite integration technique. The model of the injection clamp is validated by comparison with measurements and with the results obtained by SPICE. The full-wave model is used to investigate EFT injection clamp calibration setup, such as that proposed in section "6.4.2 Calibration of the capacitive coupling clamp" of the IEC 61000-4-4 new Edition (i.e., the 3rd). ©2010 IEEE.
2010
2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
capacitive coupling; electric fast transient; electrical fast transient/burst (eft/b); finite integration technique; finite integration technique (fit); full-wave analysis; immunity; microwave studio; spice
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Full-wave investigation of EFT injection clamp calibration setup / Spartaco, Caniggia; Eric, Dudenhoeffer; Maradei, Francescaromana. - ELETTRONICO. - (2010), pp. 602-607. (Intervento presentato al convegno 2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 tenutosi a Fort Lauderdale, FL nel 25 July 2010 through 30 July 2010) [10.1109/isemc.2010.5711345].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/211060
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