Different excitation means, protons, photons and electrons (PIXE, XRFA, and EPMA, respectively) have previously been compared with regard to the figures of merit, i.e. detection power, precision and accuracy. The aim in this article is to compare synchrotron radiation SR as another excitation method with the methods mentioned above. From this point of view the evaluation of (SR) was missing as an again independently optimized excitation method and was based as previously on practical problems of trace analysis, in this case on the determinations of traces in lead. The experiment has been performed with thick homogeneous samples of lead, the same samples already used in the former work, so that a direct comparison is possible. The calculation of the figures of merit is based on the measurements of the blank values and their relative standard deviation for the detection limit and on the random errors for the precision. Regarding the thick homogeneous target of lead XRFA still turns out to be the best method, whereas Synchrotron X-Ray Fluorescence SY-XRF compares favorably, at least for larger atomic numbers Z. Even PIXE is inferior to (SY-XRF) in the case of larger Z; when information on the lateral distribution of the elements is of interest, PIXE is indispensable.
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|Titolo:||Comparison of different excitation methods for X-ray spectral analysis: the case of synchrotron radiation (SRFA)|
|Data di pubblicazione:||2000|
|Citazione:||Comparison of different excitation methods for X-ray spectral analysis: the case of synchrotron radiation (SRFA) / Gigante, Giovanni Ettore; Gonsior, B.. - In: FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY. - ISSN 0937-0633. - STAMPA. - 368:7(2000), pp. 644-648.|
|Appare nella tipologia:||01a Articolo in rivista|