In this paper a finite-difference time domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method permits avoidance of the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to carry out the analysis of ESD events in some configurations

Analysis of upset and failures due to ESD by the FDTD-INBCs method / Maradei, Francescaromana; Raugi, M.. - STAMPA. - 1:(2000), pp. 623-630. (Intervento presentato al convegno 2000 IEEE Industry Applications Conference tenutosi a Rome, Italy nel 8-12 Oct., 2000) [10.1109/IAS.2000.881176].

Analysis of upset and failures due to ESD by the FDTD-INBCs method

MARADEI, Francescaromana;
2000

Abstract

In this paper a finite-difference time domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method permits avoidance of the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to carry out the analysis of ESD events in some configurations
2000
2000 IEEE Industry Applications Conference
Shields; electrostatic discharge; FDTD
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Analysis of upset and failures due to ESD by the FDTD-INBCs method / Maradei, Francescaromana; Raugi, M.. - STAMPA. - 1:(2000), pp. 623-630. (Intervento presentato al convegno 2000 IEEE Industry Applications Conference tenutosi a Rome, Italy nel 8-12 Oct., 2000) [10.1109/IAS.2000.881176].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/195823
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