Low-energy calibration of XENON1T with an internal 37Ar source

Aprile, E.; Abe, K.; Agostini, F.; Ahmed Maouloud, S.; Alfonsi, M.; Althueser, L.; Andrieu, B.; Angelino, E.; Angevaare, J. R.; Antochi, V. C.; Antón Martin, D.; Arneodo, F.; Baudis, L.; Baxter, A. L.; Bellagamba, L.; Biondi, R.; Bismark, A.; Brown, A.; Bruenner, S.; Bruno, G.; Budnik, R.; Bui, T. K.; Cai, C.; Capelli, C.; Cardoso, J. M. R.; Cichon, D.; Colijn, A. P.; Conrad, J.; Cuenca-García, J. J.; Cussonneau, J. P.; D’Andrea, V.; Decowski, M. P.; Di Gangi, P.; Di Pede, S.; Diglio, S.; Eitel, K.; Elykov, A.; Farrell, S.; Ferella, A. D.; Ferrari, C.; Fischer, H.; Fulgione, W.; Gaemers, P.; Gaior, R.; Gallo Rosso, A.; Galloway, M.; Gao, F.; Glade-Beucke, R.; Grandi, L.; Grigat, J.; Guida, M.; Hammann, R.; Higuera, A.; Hils, C.; Hoetzsch, L.; Howlett, J.; Iacovacci, M.; Itow, Y.; Jakob, J.; Joerg, F.; Joy, A.; Kato, N.; Kara, M.; Kavrigin, P.; Kazama, S.; Kobayashi, M.; Koltman, G.; Kopec, A.; Kuger, F.; Landsman, H.; Lang, R. F.; Levinson, L.; Li, I.; Li, S.; Liang, S.; Lindemann, S.; Lindner, M.; Liu, K.; Loizeau, J.; Lombardi, F.; Long, J.; Lopes, J. A. M.; Ma, Y.; Macolino, C.; Mahlstedt, J.; Mancuso, A.; Manenti, L.; Marignetti, F.; Marrodán Undagoitia, T.; Martens, K.; Masbou, J.; Masson, D.; Masson, E.; Mastroianni, S.; Messina, M.; Miuchi, K.; Mizukoshi, K.; Molinario, A.; Moriyama, S.; Morå, K.; Mosbacher, Y.; Murra, M.; Müller, J.; Ni, K.; Oberlack, U.; Paetsch, B.; Palacio, J.; Peres, R.; Peters, C.; Pienaar, J.; Pierre, M.; Pizzella, V.; Plante, G.; Qi, J.; Qin, J.; Ramírez García, D.; Reichard, S.; Rocchetti, A.; Rupp, N.; Sanchez, L.; Sanchez-Lucas, P.; Dos Santos, J. M. F.; Sarnoff, I.; Sartorelli, G.; Schreiner, J.; Schulte, D.; Schulte, P.; Schulze Eißing, H.; Schumann, M.; Scotto Lavina, L.; Selvi, M.; Semeria, F.; Shagin, P.; Shi, S.; Shockley, E.; Silva, M.; Simgen, H.; Takeda, A.; Tan, P. -L.; Terliuk, A.; Thers, D.; Toschi, F.; Trinchero, G.; Tunnell, C.; Tönnies, F.; Valerius, K.; Volta, G.; Weinheimer, C.; Weiss, M.; Wenz, D.; Wittweg, C.; Wolf, T.; Xu, D.; Xu, Z.; Yamashita, M.; Yang, L.; Ye, J.; Yuan, L.; Zavattini, G.; Zerbo, S.; Zhong, M.; Zhu, T.; Geppert, C.; Riemer, J.

doi:10.1140/epjc/s10052-023-11512-z

A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal 37Ar source was performed. This calibration source features a 35-day half-life and provides two mono-energetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be (32.3±0.3) photons/keV and (40.6±0.5) electrons/keV, respectively, in agreement with other measurements and with NEST predictions. The electron yield at 0.27 keV is also measured and it is (68.0+6.3−3.7) electrons/keV. The 37Ar calibration confirms that the detector is well-understood in the energy region close to the detection threshold, with the 2.82 keV line reconstructed at (2.83±0.02) keV, which further validates the model used to interpret the low-energy electronic recoil excess previously reported by XENON1T. The ability to efficiently remove argon with cryogenic distillation after the calibration proves that 37Ar can be considered as a regular calibration source for multi-tonne xenon detectors.

Low-energy calibration of XENON1T with an internal 37Ar source / Aprile, E., Abe, K., Agostini, F., Ahmed Maouloud, S., Alfonsi, M., Althueser, L., Andrieu, B., Angelino, E., Angevaare, J.R., Antochi, V.C., Antón Martin, D., Arneodo, F., Baudis, L., Baxter, A.L., Bellagamba, L., Biondi, R., Bismark, A., Brown, A., Bruenner, S., Bruno, G., et al.. - In: THE EUROPEAN PHYSICAL JOURNAL. C, PARTICLES AND FIELDS. - ISSN 1434-6044. - 83:6(2023), pp. 1-15. [10.1140/epjc/s10052-023-11512-z]