We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n times
Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device / De Martini, F., Mazzei, A., Ricci, M., D'Ariano, G.M.. - In: PHYSICAL REVIEW A. - ISSN 1050-2947. - 67:6(2003), p. 062307-1. [10.1103/PhysRevA.67.062307]
Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device
RICCI, Marco;
2003
Abstract
We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n timesI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
