Mott’s variable range hopping (v.r.h.) is the phonon-induced hopping of electrons in disordered solids (such as doped semiconductors) within the regime of strong Anderson localization. It was introduced by N. Mott to explain the anomalous low temperature conductivity decay in dimension d ≥ 2, corresponding now to the so called Mott’s law. We provide a rigorous derivation of this Physics law for two effec- tive models of Mott v.r.h.: the random resistor network for v.r.h. of [1, Section IV] and Mott’s random walk. We also determine the constant multiplying the power of the inverse temperature in the exponent in Mott’s law, which was an open problem also on a heuristic level.

Mott’s law for the v.r.h. random resistor network and for Mott’s random walk / Faggionato, A.. - In: PROBABILITY THEORY AND RELATED FIELDS. - ISSN 0178-8051. - 194:(2026), pp. 1-40. [10.1007/s00440-025-01463-9]

Mott’s law for the v.r.h. random resistor network and for Mott’s random walk

Alessandra Faggionato
Primo
2026

Abstract

Mott’s variable range hopping (v.r.h.) is the phonon-induced hopping of electrons in disordered solids (such as doped semiconductors) within the regime of strong Anderson localization. It was introduced by N. Mott to explain the anomalous low temperature conductivity decay in dimension d ≥ 2, corresponding now to the so called Mott’s law. We provide a rigorous derivation of this Physics law for two effec- tive models of Mott v.r.h.: the random resistor network for v.r.h. of [1, Section IV] and Mott’s random walk. We also determine the constant multiplying the power of the inverse temperature in the exponent in Mott’s law, which was an open problem also on a heuristic level.
2026
Marked simple point process; poisson point process ; Mott’s random walk; random resistor network for v.r.h.; Mott’s law; percolation; stochastic homogenization
01 Pubblicazione su rivista::01a Articolo in rivista
Mott’s law for the v.r.h. random resistor network and for Mott’s random walk / Faggionato, A.. - In: PROBABILITY THEORY AND RELATED FIELDS. - ISSN 0178-8051. - 194:(2026), pp. 1-40. [10.1007/s00440-025-01463-9]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1767979
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