Measurement-based uncomputation (MBU) is a technique used to perform probabilistic uncomputation of quantum circuits. We formalize this technique for the case of single-qubit registers, and we show applications to modular arithmetic. Using MBU, we reduce Toffoli count and depth by 10% to 15% for modular adders based on the architecture of [1], and by almost 25% for modular adders based on the architecture of [2]. Our results have the potential to improve other circuits for modular arithmetic, such as modular multiplication and modular exponentiation, and can find applications in quantum cryptanalysis.

Measurement-based uncomputation of quantum circuits for modular arithmetic / Luongo, Alessandro; Miti, Antonio Michele; Narasimhachar, Varun; Sireesh, Adithya. - (2025). (Intervento presentato al convegno 2025 62nd ACM/IEEE Design Automation Conference (DAC) tenutosi a San Francisco, USA) [10.1109/dac63849.2025.11132981].

Measurement-based uncomputation of quantum circuits for modular arithmetic

Antonio Michele Miti;
2025

Abstract

Measurement-based uncomputation (MBU) is a technique used to perform probabilistic uncomputation of quantum circuits. We formalize this technique for the case of single-qubit registers, and we show applications to modular arithmetic. Using MBU, we reduce Toffoli count and depth by 10% to 15% for modular adders based on the architecture of [1], and by almost 25% for modular adders based on the architecture of [2]. Our results have the potential to improve other circuits for modular arithmetic, such as modular multiplication and modular exponentiation, and can find applications in quantum cryptanalysis.
2025
2025 62nd ACM/IEEE Design Automation Conference (DAC)
Modular arithmetic, Quantum computing, Circuit optimization, Qubit, Design Automation
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Measurement-based uncomputation of quantum circuits for modular arithmetic / Luongo, Alessandro; Miti, Antonio Michele; Narasimhachar, Varun; Sireesh, Adithya. - (2025). (Intervento presentato al convegno 2025 62nd ACM/IEEE Design Automation Conference (DAC) tenutosi a San Francisco, USA) [10.1109/dac63849.2025.11132981].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1746864
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