We study the effect of doping on the electron-phonon interaction and on the phonon frequencies in doped semiconductors, taking into account the screening in the presence of free carriers at finite temperature. We study the impact of screening on the Fröhlich-like vertex and on the long-range components of the dynamical matrix, going beyond the state-of-the-art description for undoped crystals, thanks to the development of a computational method based on maximally localized Wannier functions. We apply our approach to cubic silicon carbide, where in the presence of doping the Fröhlich coupling and the longitudinal-transverse phonon splitting are strongly reduced, thereby influencing observable properties such as the electronic lifetime.

Electron-phonon Interaction and longitudinal-transverse phonon splitting in doped semiconductors / Macheda, F., Barone, P., Mauri, F.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 129:18(2022), pp. 1-6. [10.1103/PhysRevLett.129.185902]

Electron-phonon Interaction and longitudinal-transverse phonon splitting in doped semiconductors

Macheda, Francesco
;
Barone, Paolo;Mauri, Francesco
2022

Abstract

We study the effect of doping on the electron-phonon interaction and on the phonon frequencies in doped semiconductors, taking into account the screening in the presence of free carriers at finite temperature. We study the impact of screening on the Fröhlich-like vertex and on the long-range components of the dynamical matrix, going beyond the state-of-the-art description for undoped crystals, thanks to the development of a computational method based on maximally localized Wannier functions. We apply our approach to cubic silicon carbide, where in the presence of doping the Fröhlich coupling and the longitudinal-transverse phonon splitting are strongly reduced, thereby influencing observable properties such as the electronic lifetime.
2022
electron-phonon interactions; semiconductor doping; silicon carbide
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Electron-phonon Interaction and longitudinal-transverse phonon splitting in doped semiconductors / Macheda, F., Barone, P., Mauri, F.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 129:18(2022), pp. 1-6. [10.1103/PhysRevLett.129.185902]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1693575
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