Abstract The sample preparation is one of the fundamental steps to obtain a successful correlative microscopy experiment, and for non-conductive materials the deposition of a thin metal coating is often mandatory for a good SEM observation. Nevertheless, in case of correlative experiment, where AFM and Raman spectroscopy are involved in the workflow, this deposition will have a direct influence on both the analysis. In this paper, an investigation about the most common conductive materials used in SEM sample preparation, such as chromium, graphite and gold, and their behaviour in the construction of correlative microscopy workflow is proposed, showing in our results, that chromium is the best choice for this type of combined analysis.

Influence of the conductive coating on combined {CPEM} and Raman analysis / Mura, F; Dinarelli, S; Mancini, C; Proietti, A; Buccini, L; Silvestri, S; Passeri, D; Rossi, Marco. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 2579:1(2023), p. 012012. (Intervento presentato al convegno Nanoinnovation 2022 tenutosi a Rome) [10.1088/1742-6596/2579/1/012012].

Influence of the conductive coating on combined {CPEM} and Raman analysis

F Mura;S Dinarelli;C Mancini;A Proietti;L Buccini;S Silvestri;D Passeri;Marco Rossi
2023

Abstract

Abstract The sample preparation is one of the fundamental steps to obtain a successful correlative microscopy experiment, and for non-conductive materials the deposition of a thin metal coating is often mandatory for a good SEM observation. Nevertheless, in case of correlative experiment, where AFM and Raman spectroscopy are involved in the workflow, this deposition will have a direct influence on both the analysis. In this paper, an investigation about the most common conductive materials used in SEM sample preparation, such as chromium, graphite and gold, and their behaviour in the construction of correlative microscopy workflow is proposed, showing in our results, that chromium is the best choice for this type of combined analysis.
2023
Nanoinnovation 2022
CPEM , Raman , SEM, correlative microscopy
04 Pubblicazione in atti di convegno::04h Atto di convegno in rivista scientifica o di classe A
Influence of the conductive coating on combined {CPEM} and Raman analysis / Mura, F; Dinarelli, S; Mancini, C; Proietti, A; Buccini, L; Silvestri, S; Passeri, D; Rossi, Marco. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 2579:1(2023), p. 012012. (Intervento presentato al convegno Nanoinnovation 2022 tenutosi a Rome) [10.1088/1742-6596/2579/1/012012].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1689233
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