An experimental study about the relative merits of using a high-speed digital-acquisition system to measure directly the strain-gage resistance rather than using a conventional Wheatstone bridge, is carried out.Both strain gages, with a nominal resistance of 120-OMEGA and 1 k-OMEGA, are simulated with precision resistors and the output signals were acquired over a time of 48 and 144 hours; furthermore, the effects in metrological performances caused by a statistical filtering are evaluated.The results show that the implementation of the statistical filtering gains a considerable improvement in gathering strain-gage-resistance readings. On the other hand such a procedure causes, obviously, a loss of performance with regard to the acquisition rate, therefore to the dynamic data-collecting capabilities. In any case the intrinsic resolution of the 12-bit a/d converter, utilized in the present experimental analysis, causes a limitation for measurement accuracy in the range of hundreds-mu-m/m.
An experimental analysis of accuracy and precision of a high-speed strain-gage system based on the direct-resistance method / Cappa, P.; Del Prete, Z.. - In: EXPERIMENTAL MECHANICS. - ISSN 0014-4851. - 32:1(1992), pp. 78-82. [10.1007/BF02317990]
An experimental analysis of accuracy and precision of a high-speed strain-gage system based on the direct-resistance method
Cappa, P.;Del Prete, Z.
1992
Abstract
An experimental study about the relative merits of using a high-speed digital-acquisition system to measure directly the strain-gage resistance rather than using a conventional Wheatstone bridge, is carried out.Both strain gages, with a nominal resistance of 120-OMEGA and 1 k-OMEGA, are simulated with precision resistors and the output signals were acquired over a time of 48 and 144 hours; furthermore, the effects in metrological performances caused by a statistical filtering are evaluated.The results show that the implementation of the statistical filtering gains a considerable improvement in gathering strain-gage-resistance readings. On the other hand such a procedure causes, obviously, a loss of performance with regard to the acquisition rate, therefore to the dynamic data-collecting capabilities. In any case the intrinsic resolution of the 12-bit a/d converter, utilized in the present experimental analysis, causes a limitation for measurement accuracy in the range of hundreds-mu-m/m.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
