X-ray microscopy (XRM) is a non-destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation-matter interactions. XRM is particularly suitable to afford in situ images of inner parts of a battery and for the early diagnosis of its degradation in a non-invasive way. Since traditional characterization techniques (SEM, AFM, XRD) often require the removal of a component from the encapsulated device that may lead to non-desired contamination of the sample, the non-destructive multi-scale potential of XRM represents an important improvement to batteries investigation. In this work, we present the advanced technical features that characterize a sub-micron X-ray microscopy system, its use for the investigation of hidden and internal structures of different types of batteries and to understand their behavior and evolution after many charge/discharge cycles.
X-Ray microscopy: a non-destructive multi-scale imaging to study the inner workings of batteries / Cognigni, F.; Pasquali, M.; Prosini, P. P.; Paoletti, C.; Aurora, A.; Scaramuzzo, F. A.; Rossi, Marco. - In: CHEMELECTROCHEM. - ISSN 2196-0216. - 10:7(2023). [10.1002/celc.202201081]
X-Ray microscopy: a non-destructive multi-scale imaging to study the inner workings of batteries
Cognigni F.
Primo
;Pasquali M.Secondo
;Scaramuzzo F. A.Penultimo
;Rossi MarcoUltimo
2023
Abstract
X-ray microscopy (XRM) is a non-destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation-matter interactions. XRM is particularly suitable to afford in situ images of inner parts of a battery and for the early diagnosis of its degradation in a non-invasive way. Since traditional characterization techniques (SEM, AFM, XRD) often require the removal of a component from the encapsulated device that may lead to non-desired contamination of the sample, the non-destructive multi-scale potential of XRM represents an important improvement to batteries investigation. In this work, we present the advanced technical features that characterize a sub-micron X-ray microscopy system, its use for the investigation of hidden and internal structures of different types of batteries and to understand their behavior and evolution after many charge/discharge cycles.File | Dimensione | Formato | |
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