X-ray microscopy (XRM) is a non-destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation-matter interactions. XRM is particularly suitable to afford in situ images of inner parts of a battery and for the early diagnosis of its degradation in a non-invasive way. Since traditional characterization techniques (SEM, AFM, XRD) often require the removal of a component from the encapsulated device that may lead to non-desired contamination of the sample, the non-destructive multi-scale potential of XRM represents an important improvement to batteries investigation. In this work, we present the advanced technical features that characterize a sub-micron X-ray microscopy system, its use for the investigation of hidden and internal structures of different types of batteries and to understand their behavior and evolution after many charge/discharge cycles.

X‐ray microscopy. A non‐destructive multi‐scale imaging to study the inner workings of batteries / Cognigni, Flavio; Pasquali, Mauro; Prosini, PIER PAOLO; Paoletti, Claudia; Aurora, Annalisa; Scaramuzzo, FRANCESCA ANNA; Rossi, Marco. - In: CHEMELECTROCHEM. - ISSN 2196-0216. - 10:7(2023), pp. 1-9. [10.1002/celc.202300100]

X‐ray microscopy. A non‐destructive multi‐scale imaging to study the inner workings of batteries

Flavio Cognigni
Primo
;
Mauro Pasquali;Pier Paolo Prosini;Claudia Paoletti;Annalisa Aurora;Francesca Anna Scaramuzzo;Marco Rossi
Ultimo
Funding Acquisition
2023

Abstract

X-ray microscopy (XRM) is a non-destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation-matter interactions. XRM is particularly suitable to afford in situ images of inner parts of a battery and for the early diagnosis of its degradation in a non-invasive way. Since traditional characterization techniques (SEM, AFM, XRD) often require the removal of a component from the encapsulated device that may lead to non-desired contamination of the sample, the non-destructive multi-scale potential of XRM represents an important improvement to batteries investigation. In this work, we present the advanced technical features that characterize a sub-micron X-ray microscopy system, its use for the investigation of hidden and internal structures of different types of batteries and to understand their behavior and evolution after many charge/discharge cycles.
2023
X-ray tomography; battery; 3D reconstructiion
01 Pubblicazione su rivista::01a Articolo in rivista
X‐ray microscopy. A non‐destructive multi‐scale imaging to study the inner workings of batteries / Cognigni, Flavio; Pasquali, Mauro; Prosini, PIER PAOLO; Paoletti, Claudia; Aurora, Annalisa; Scaramuzzo, FRANCESCA ANNA; Rossi, Marco. - In: CHEMELECTROCHEM. - ISSN 2196-0216. - 10:7(2023), pp. 1-9. [10.1002/celc.202300100]
File allegati a questo prodotto
File Dimensione Formato  
Cognigni_X-Ray Microscopy_2023.pdf

accesso aperto

Tipologia: Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza: Creative commons
Dimensione 2 MB
Formato Adobe PDF
2 MB Adobe PDF

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1686307
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 7
  • ???jsp.display-item.citation.isi??? 2
social impact