In this work we report on the extensive characterization of amorphous silicon carbide (a-SiC) coatings prepared by physical deposition methods. Our investigation is performed within the perspective application of a-SiC as an optical material for high-precision optical experiments and, in particular, in gravitational wave interferometry. We compare the results obtained with two different sputtering systems [a standard radio frequency (rf) magnetron sputtering and an ion-beam sputtering] to grasp the impact of two different setups on the repeatability of the results. After a thorough characterization of structural, morphological, and compositional characteristics of the prepared samples, we focus on a detailed study of the optical and mechanical losses in those materials. Mechanical losses are further investigated from a microscopic point of view by comparing our experimental results with molecular dynamic simulations of the amorphous SiC structure: first we define a protocol to generate a numerical model of the amorphous film, capturing the main features of the real system; then we simulate its dynamical behavior upon deformation in order to obtain its mechanical response.
Measurement and Simulation of Mechanical and Optical Properties of Sputtered Amorphous SiC Coatings / Favaro, G., Bazzan, M., Amato, A., Arciprete, F., Cesarini, E., Corso, A.J., De Matteis, F., Dao, T.H., Granata, M., Honrado-Benitez, C., Gutierrez-Luna, N., Larruquert, J.I., Lorenzin, G., Lumaca, D., Maggioni, G., Magnozzi, M., Pelizzo, M.G., Placidi, E., Prosposito, P., Puosi, F.. - In: PHYSICAL REVIEW APPLIED. - ISSN 2331-7019. - 18:4(2022). [10.1103/PhysRevApplied.18.044030]
Measurement and Simulation of Mechanical and Optical Properties of Sputtered Amorphous SiC Coatings
Placidi E.Writing – Original Draft Preparation
;
2022
Abstract
In this work we report on the extensive characterization of amorphous silicon carbide (a-SiC) coatings prepared by physical deposition methods. Our investigation is performed within the perspective application of a-SiC as an optical material for high-precision optical experiments and, in particular, in gravitational wave interferometry. We compare the results obtained with two different sputtering systems [a standard radio frequency (rf) magnetron sputtering and an ion-beam sputtering] to grasp the impact of two different setups on the repeatability of the results. After a thorough characterization of structural, morphological, and compositional characteristics of the prepared samples, we focus on a detailed study of the optical and mechanical losses in those materials. Mechanical losses are further investigated from a microscopic point of view by comparing our experimental results with molecular dynamic simulations of the amorphous SiC structure: first we define a protocol to generate a numerical model of the amorphous film, capturing the main features of the real system; then we simulate its dynamical behavior upon deformation in order to obtain its mechanical response.| File | Dimensione | Formato | |
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PhysRevApplied.18.044030.pdf
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