We show that residence time measures can be used to identify the geometrical and transmission properties of a defect along a path. The model we study is based on a one-dimensional simple random walk. The sites of the lattice are regular, i.e., the jumping probabilities are the same in each site, except for a site, called defect, where the jumping probabilities are different. At each side of the lattice an absorbing site is present. We show that by measuring the fraction of particles crossing the channel and/or the typical time they need to cross it, it is possible to identify the main features of the lattice and of the defect site, namely, the jumping probabilities at the regular and at the defect site and the position of the defect in the lattice.

Localization of defects via residence time measures / Ciallella, A.; Cirillo, E. N. M.; Vantaggi, B.. - In: SIAM JOURNAL ON APPLIED MATHEMATICS. - ISSN 0036-1399. - 82:2(2022), pp. 502-525. [10.1137/20M1380284]

Localization of defects via residence time measures

Cirillo E. N. M.;Vantaggi B.
2022

Abstract

We show that residence time measures can be used to identify the geometrical and transmission properties of a defect along a path. The model we study is based on a one-dimensional simple random walk. The sites of the lattice are regular, i.e., the jumping probabilities are the same in each site, except for a site, called defect, where the jumping probabilities are different. At each side of the lattice an absorbing site is present. We show that by measuring the fraction of particles crossing the channel and/or the typical time they need to cross it, it is possible to identify the main features of the lattice and of the defect site, namely, the jumping probabilities at the regular and at the defect site and the position of the defect in the lattice.
2022
defect localization; random walk; residence time
01 Pubblicazione su rivista::01a Articolo in rivista
Localization of defects via residence time measures / Ciallella, A.; Cirillo, E. N. M.; Vantaggi, B.. - In: SIAM JOURNAL ON APPLIED MATHEMATICS. - ISSN 0036-1399. - 82:2(2022), pp. 502-525. [10.1137/20M1380284]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1640185
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