X-ray high-resolution spectroscopy for laser-produced plasma

The study of the emission spectrum gives information about the material generating the spectrum itself and the condition in which this is generated. The wavelength spectra lines are linked to the specific element and plasma conditions (electron temperature, density), while their shape is influenced by several physical effects like Stark and Doppler ones. In this work we study the X-ray emission spectra of a copper laser-produced plasma by using a spherical bent crystal spectrometer to measure the electron temperature. The facility used is the laser TVLPS, at the Tor Vergata University in Rome. It consists of a Nd:Glass source (in first harmonic - 1064 nm) whose pulse parameters are: 8 J in energy, time duration of 15 ns and a focal spot diameter of 200 μm. The adopted spectrometer is based on a spherical bent crystal of muscovite. The device combines the focusing property of a spherical mirror with the Bragg's law. This allows to obtain a great power resolution but a limited range of analysis. In our case the resolution is on average 80 eV. As it is well-known, the position of the detector on the Rowland's circle is linked to the specific spectral range which has been studied. To select the area to be investigated, we acquired spectra by means of a flat spectrometer. The selected area is centered on 8.88 Å. To calibrate the spectrum we wrote a ray-tracing MATLAB code, which calculates the detector alignment parameters and calibration curve. We used the method of line ratio to measure the electron temperature. This is possible because we assumed the plasma to be in LTE condition. The temperature value was obtained comparing the experimental one, given by the line ratio, with the theoretical one, preceded by FLYCHK simulations.