Two-dimensional indium selenide (InSe) has attracted extensive attention recently due to its record-high charge carrier mobility and photoresponsivity in the fields of electronics and optoelectronics. Nevertheless, the mechanical properties of this material in the ultra-thin regime have not been investigated yet. Here, we present our efforts to determine the Young's modulus of thin InSe (∼1-2 layers to ∼34 layers) flakes experimentally by using a buckling-based methodology. We find that the Young's modulus has a value of 23.1 ± 5.2 GPa, one of the lowest values reported to date for crystalline two-dimensional materials. This superior flexibility can be very attractive for different applications, such as strain engineering and flexible electronics.

InSe: A two-dimensional semiconductor with superior flexibility / Zhao, Q.; Frisenda, R.; Wang, T.; Castellanos-Gomez, A.. - In: NANOSCALE. - ISSN 2040-3364. - 11:20(2019), pp. 9845-9850. [10.1039/c9nr02172h]

InSe: A two-dimensional semiconductor with superior flexibility

Frisenda R.
;
2019

Abstract

Two-dimensional indium selenide (InSe) has attracted extensive attention recently due to its record-high charge carrier mobility and photoresponsivity in the fields of electronics and optoelectronics. Nevertheless, the mechanical properties of this material in the ultra-thin regime have not been investigated yet. Here, we present our efforts to determine the Young's modulus of thin InSe (∼1-2 layers to ∼34 layers) flakes experimentally by using a buckling-based methodology. We find that the Young's modulus has a value of 23.1 ± 5.2 GPa, one of the lowest values reported to date for crystalline two-dimensional materials. This superior flexibility can be very attractive for different applications, such as strain engineering and flexible electronics.
2019
2D materials; Young's modulus; Buckling metrology;
01 Pubblicazione su rivista::01a Articolo in rivista
InSe: A two-dimensional semiconductor with superior flexibility / Zhao, Q.; Frisenda, R.; Wang, T.; Castellanos-Gomez, A.. - In: NANOSCALE. - ISSN 2040-3364. - 11:20(2019), pp. 9845-9850. [10.1039/c9nr02172h]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1624314
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