To study the Mueller matrix polarimetry for the characterization of wood and Teflon flat samples

In our manuscript, we carry out the Mueller matrix polarimetry for the characterization of wood and polytetrafluoroethylene (PTFE) or Teflon flat samples. Polarization measurements allows to enhance the imaging contrast of the anisotropic wood (Horizontal (H) and Vertical (V)) superficial fibers tissues and isotropic material (Teflon). We study the polarization-sensitive parameters for better investigations of the micro- and macro- structural and optical properties of complex tissues. The polarization imaging methodology has evolved to accept increasingly complex parametric measurements. The Mueller matrix is now generally calculated using a polarimetry technique. Herein, we attempt to study the difference between wood H, wood V, and Teflon samples. We calculated 3x3 Mueller matrix, which can be used to describe an intuitive overview of the material characteristics. We have interpreted our experimental results of Mueller matrix coefficients in terms of graphical representation using two different approaches named MS_1 and MS_2. This study gives us a new idea on the contrast mechanisms of polarization-sensitive measurements for different samples wood H, wood V, and Teflon and may provide new and simple diagnostic techniques for biological applications.