The paper proposes a hand held eddy current based measurement instrument for the detection of thin defect on conductive planar specimens. The measurement instrument adopts a Giant Magneto Resistance based probe to detect the eddy current reaction field from the specimen and a suitable positioning system to measure the sensor position in the specimen plane
A novel biaxial probe implementing multifrequency excitation and SVM processing for NDT / Bernieri, A.; Betta, G.; Ferrigno, L.; Laracca, M.. - (2013), pp. 284-289. (Intervento presentato al convegno 2013 IEEE International instrumentation and measurement technology conference (12MTC) tenutosi a Minneapolis, MN; United States) [10.1109/I2MTC.2013.6555425].
A novel biaxial probe implementing multifrequency excitation and SVM processing for NDT
Laracca M.
2013
Abstract
The paper proposes a hand held eddy current based measurement instrument for the detection of thin defect on conductive planar specimens. The measurement instrument adopts a Giant Magneto Resistance based probe to detect the eddy current reaction field from the specimen and a suitable positioning system to measure the sensor position in the specimen plane| File | Dimensione | Formato | |
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