The development of lift-off invariant strategies is one of the main goals in Eddy Current Non-Destructive Testing research. In this paper various imaging procedures for Eddy Current Testing are analyzed with respect to change of lift-off and tested by varying randomly the lift-off value at every point in a measurement grid. The experimental data, collected with both chirp and multi-frequency excitation, shows that imaging procedures relying on phase analysis are quite insensitive to liftoff variation and then more robust with respect to imaging procedures based on the visualization of amplitude-derived features.

Analysis of the influence of lift-off variation on Eddy-Current images / Ricci, Marco; Silipigni, Giuseppe; Ferrigno, Luigi; Laracca, Marco; Adewale Ibukun, D.; Tian Gui, Yun. - (2015), pp. 181-186. (Intervento presentato al convegno 2nd IEEE International Workshop on Metrology for Aerospace tenutosi a Benevento - Italy) [10.1109/MetroAeroSpace.2015.7180650].

Analysis of the influence of lift-off variation on Eddy-Current images

Laracca Marco;
2015

Abstract

The development of lift-off invariant strategies is one of the main goals in Eddy Current Non-Destructive Testing research. In this paper various imaging procedures for Eddy Current Testing are analyzed with respect to change of lift-off and tested by varying randomly the lift-off value at every point in a measurement grid. The experimental data, collected with both chirp and multi-frequency excitation, shows that imaging procedures relying on phase analysis are quite insensitive to liftoff variation and then more robust with respect to imaging procedures based on the visualization of amplitude-derived features.
2015
2nd IEEE International Workshop on Metrology for Aerospace
Eddy Current Testing; image processing; lift-off invariance
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Analysis of the influence of lift-off variation on Eddy-Current images / Ricci, Marco; Silipigni, Giuseppe; Ferrigno, Luigi; Laracca, Marco; Adewale Ibukun, D.; Tian Gui, Yun. - (2015), pp. 181-186. (Intervento presentato al convegno 2nd IEEE International Workshop on Metrology for Aerospace tenutosi a Benevento - Italy) [10.1109/MetroAeroSpace.2015.7180650].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1526474
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