Scientific research on non-destructive testing is constantly looking for new solutions, about sensors and digital signal processing techniques, to improve the detection and characterization of defects in materials. The authors have engaged this particular line of research with particular reference to non-destructive testing applied to the conductive material through the use of eddy currents. After the realization of a novel instrument based on a Giant Magneto-Resistance probe, in this paper they propose the use of a suitable multi-frequency approach to improve reliability and accuracy in the defect estimation. Key features of the proposed instrument are the capability to detect, locate, and characterize thin defects as superficial and sub-superficial cracks. A number of tests carried out both in simulation and real environments show the goodness of the proposal.

Multi-frequency ECT method for defect depth estimation / Bernieri, A.; Betta, G.; Ferrigno, L.; Laracca, M.. - (2012), pp. 114-119. (Intervento presentato al convegno 2012 IEEE Sensors applications symposium, SAS 2012 tenutosi a Brescia; Italy) [10.1109/SAS.2012.6166304].

Multi-frequency ECT method for defect depth estimation

M. Laracca
2012

Abstract

Scientific research on non-destructive testing is constantly looking for new solutions, about sensors and digital signal processing techniques, to improve the detection and characterization of defects in materials. The authors have engaged this particular line of research with particular reference to non-destructive testing applied to the conductive material through the use of eddy currents. After the realization of a novel instrument based on a Giant Magneto-Resistance probe, in this paper they propose the use of a suitable multi-frequency approach to improve reliability and accuracy in the defect estimation. Key features of the proposed instrument are the capability to detect, locate, and characterize thin defects as superficial and sub-superficial cracks. A number of tests carried out both in simulation and real environments show the goodness of the proposal.
2012
2012 IEEE Sensors applications symposium, SAS 2012
multifrequency eddy current testing; GMR sensor; defect depth estimation
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Multi-frequency ECT method for defect depth estimation / Bernieri, A.; Betta, G.; Ferrigno, L.; Laracca, M.. - (2012), pp. 114-119. (Intervento presentato al convegno 2012 IEEE Sensors applications symposium, SAS 2012 tenutosi a Brescia; Italy) [10.1109/SAS.2012.6166304].
File allegati a questo prodotto
File Dimensione Formato  
Bernieri_ Multi-frequency ECT_2012.pdf

solo gestori archivio

Tipologia: Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 1.27 MB
Formato Adobe PDF
1.27 MB Adobe PDF   Contatta l'autore

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1526393
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 18
  • ???jsp.display-item.citation.isi??? 7
social impact