Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults.

On the analysis of reed solomon coding for resilience to transient/permanent faults in highly reliable memories / Schiano, L; Ottavi, M; Lombardi, F; Pontarelli, S; Salsano, A. - 1:(2005), pp. 580-585. (Intervento presentato al convegno Design and Testing in Europe (DATE) 2005 tenutosi a Munich; Germany) [10.1109/DATE.2005.227].

On the analysis of reed solomon coding for resilience to transient/permanent faults in highly reliable memories

Pontarelli S;
2005

Abstract

Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults.
2005
Design and Testing in Europe (DATE) 2005
Dynamic Redundancy; High Reliability Systems; Reed-Solomon Codes; Reliability Evaluation; Scrubbing
04 Pubblicazione in atti di convegno::04c Atto di convegno in rivista
On the analysis of reed solomon coding for resilience to transient/permanent faults in highly reliable memories / Schiano, L; Ottavi, M; Lombardi, F; Pontarelli, S; Salsano, A. - 1:(2005), pp. 580-585. (Intervento presentato al convegno Design and Testing in Europe (DATE) 2005 tenutosi a Munich; Germany) [10.1109/DATE.2005.227].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1523254
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