A complete set of polarised XAS spectra at Cu L3 and Bi L3- edges have been recorded on a well characterised single crystals of Bi2Sr2CaCu2O8+ superconductor. The Cu L3 spectra shows an energy difference of 400 meV between z(3d3z2-r2) and x,y(3dx2-y2) components, with a significant intensity in E parallel-to c polarisation. The Bi L3-edges show clearly the energy shift of superconductor spectra towards low energy with respect to Bi(III) references confirming again the Bi-O layers as electron reservoir.

XANES STUDY OF DOPING AND REDOX MECHANISMS FOR HOLE CREATION IN BI(2212) SUPERCONDUCTING SYSTEM / K. B., Garg; Saini, Naurang Lal; P., Srivastava; B. R., Sekhar; N., Merrien; F., Studer; S., Durcok. - In: JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES. - ISSN 0021-4922. - STAMPA. - 32:32-2(1993), pp. 599-601. (Intervento presentato al convegno 7TH INTERNATIONAL CONF ON X-RAY ABSORPTION FINE STRUCTURE ( XAFS 7 ) tenutosi a KOBE, JAPAN nel AUG 23-29, 1992).

XANES STUDY OF DOPING AND REDOX MECHANISMS FOR HOLE CREATION IN BI(2212) SUPERCONDUCTING SYSTEM

SAINI, Naurang Lal;
1993

Abstract

A complete set of polarised XAS spectra at Cu L3 and Bi L3- edges have been recorded on a well characterised single crystals of Bi2Sr2CaCu2O8+ superconductor. The Cu L3 spectra shows an energy difference of 400 meV between z(3d3z2-r2) and x,y(3dx2-y2) components, with a significant intensity in E parallel-to c polarisation. The Bi L3-edges show clearly the energy shift of superconductor spectra towards low energy with respect to Bi(III) references confirming again the Bi-O layers as electron reservoir.
1993
01 Pubblicazione su rivista::01a Articolo in rivista
XANES STUDY OF DOPING AND REDOX MECHANISMS FOR HOLE CREATION IN BI(2212) SUPERCONDUCTING SYSTEM / K. B., Garg; Saini, Naurang Lal; P., Srivastava; B. R., Sekhar; N., Merrien; F., Studer; S., Durcok. - In: JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES. - ISSN 0021-4922. - STAMPA. - 32:32-2(1993), pp. 599-601. (Intervento presentato al convegno 7TH INTERNATIONAL CONF ON X-RAY ABSORPTION FINE STRUCTURE ( XAFS 7 ) tenutosi a KOBE, JAPAN nel AUG 23-29, 1992).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/133769
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