Cu L3 and O K edge polarised X-ray absorption spectroscopy has been employed to study a three-dimensional oxygen deficient perovskite single crystal of La8−xSrxCu8O20−δ (8820) (x=1.56) for E//a, E//b and E//a^45 polarizations. A careful analysis of the data shows an unmistakable presence of the itinerant eg(x2–y2) holes in it. The density of itinerant holes increases slightly as we move from E//a to the E//b orientation. This behaviour seems to be similar to the charge aggregation taking place along b-direction in an under-doped YBCO crystal in the normal state but it is rather strange as this system does not become superconducting on further cooling. This intriguing behaviour warrants further investigation.

An electronic structure study of La8−xSrxCu8O20−δ (8820) single crystal using polarized X-ray absorption spectroscopy / S. K., Gaur; R. K., Singhal; Saini, Naurang Lal; S., Dalela; C. T., Chen; H. J., Lin; K. B., Garg. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - 132:(2004), pp. 279-283. [10.1016/j.ssc.2004.07.063]

An electronic structure study of La8−xSrxCu8O20−δ (8820) single crystal using polarized X-ray absorption spectroscopy

SAINI, Naurang Lal;
2004

Abstract

Cu L3 and O K edge polarised X-ray absorption spectroscopy has been employed to study a three-dimensional oxygen deficient perovskite single crystal of La8−xSrxCu8O20−δ (8820) (x=1.56) for E//a, E//b and E//a^45 polarizations. A careful analysis of the data shows an unmistakable presence of the itinerant eg(x2–y2) holes in it. The density of itinerant holes increases slightly as we move from E//a to the E//b orientation. This behaviour seems to be similar to the charge aggregation taking place along b-direction in an under-doped YBCO crystal in the normal state but it is rather strange as this system does not become superconducting on further cooling. This intriguing behaviour warrants further investigation.
2004
01 Pubblicazione su rivista::01a Articolo in rivista
An electronic structure study of La8−xSrxCu8O20−δ (8820) single crystal using polarized X-ray absorption spectroscopy / S. K., Gaur; R. K., Singhal; Saini, Naurang Lal; S., Dalela; C. T., Chen; H. J., Lin; K. B., Garg. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - 132:(2004), pp. 279-283. [10.1016/j.ssc.2004.07.063]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/131969
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