We have performed XAFS, EDAX and AFM studies on some natural and synthetic emeralds. While the XAFS results yield information on changes in the valence of the Cr ion and the n-n distance the AFM is used to determine the areal atomic density on surface of the crystals. It is a pilot study to explore if the three techniques can offer a possible way of distinguishing between the natural and synthetic emeralds and the results are promising. (C) 2002 Elsevier Science B.V. All rights reserved.
Using XAFS, EDAX and AFM in comparative study of various natural and synthetic emeralds / P., Parikh; Saini, Naurang Lal; S., Dalela; D. M., Bhardwaj; S., Fernandes; R. P., Gupta; K. B., Garg. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 199:(2003), pp. 489-493. (Intervento presentato al convegno 3rd International Conference on Synchrotron Radiation in Materials Science tenutosi a SINGAPORE, SINGAPORE nel JAN 21-24, 2002) [10.1016/s0168-583x(02)01426-x].
Using XAFS, EDAX and AFM in comparative study of various natural and synthetic emeralds
SAINI, Naurang Lal;
2003
Abstract
We have performed XAFS, EDAX and AFM studies on some natural and synthetic emeralds. While the XAFS results yield information on changes in the valence of the Cr ion and the n-n distance the AFM is used to determine the areal atomic density on surface of the crystals. It is a pilot study to explore if the three techniques can offer a possible way of distinguishing between the natural and synthetic emeralds and the results are promising. (C) 2002 Elsevier Science B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
