The effect of sodium doping in NiO as a contact layer for perovskite solar cells is investigated. A combined X-ray diffraction and X-ray photoelectron spectroscopy analysis reveals that Na+ mostly segregates as NaOx/NaCl species around NiO crystallites, with the effect of reducing interface capacitance as revealed by impedance spectroscopy. Inspired by this finding, the NiO/perovskite interface in perovskite solar cells is modified via insertion of an ultrathin NaCl interlayer, which increases the NiO work-function by 0.3 eV. This leads to an increase of power conversion efficiency, approaching 18%, and open-circuit voltage due to a remarkable suppression of surface recombination, as revealed by photoluminescence analysis and light intensity–dependent electrical measurements.
From bulk to surface: sodium treatment reduces recombination at the nickel oxide/perovskite Interface / Di Girolamo, Diego; Phung, Nga; Jošt, Marko; Al‐ashouri, Amran; Chistiakova, Ganna; Li, Junming; Márquez, José A.; Unold, Thomas; Korte, Lars; Albrecht, Steve; Di Carlo, Aldo; Dini, Danilo; Abate, Antonio. - In: ADVANCED MATERIALS INTERFACES. - ISSN 2196-7350. - 9:17(2019), pp. 1-11. [10.1002/admi.201900789]
From bulk to surface: sodium treatment reduces recombination at the nickel oxide/perovskite Interface
Di Girolamo, DiegoPrimo
Validation
;Dini, Danilo
Penultimo
Formal Analysis
;
2019
Abstract
The effect of sodium doping in NiO as a contact layer for perovskite solar cells is investigated. A combined X-ray diffraction and X-ray photoelectron spectroscopy analysis reveals that Na+ mostly segregates as NaOx/NaCl species around NiO crystallites, with the effect of reducing interface capacitance as revealed by impedance spectroscopy. Inspired by this finding, the NiO/perovskite interface in perovskite solar cells is modified via insertion of an ultrathin NaCl interlayer, which increases the NiO work-function by 0.3 eV. This leads to an increase of power conversion efficiency, approaching 18%, and open-circuit voltage due to a remarkable suppression of surface recombination, as revealed by photoluminescence analysis and light intensity–dependent electrical measurements.File | Dimensione | Formato | |
---|---|---|---|
DiGirolamo_From-bulk_2019.pdf
solo gestori archivio
Tipologia:
Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza:
Tutti i diritti riservati (All rights reserved)
Dimensione
3.27 MB
Formato
Adobe PDF
|
3.27 MB | Adobe PDF | Contatta l'autore |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.