By means of an ultrafast opto-acoustic technique we study the nanoindentation of thin chromium films on sapphire substrates using a ceramic ball bearing. Acoustic pulses at 40 GHz returning from the film–indenter interface allow the film indentation profiles to be probed to sub-nanometer resolution over contact areas 25 lm in radius. The deformation of the films during loading is hereby revealed. Furthermore, thermal wave imaging of the contact at megahertz frequencies is simultaneously achieved.

Picosecond time scale imaging of mechanical contacts / T., Dehoux; O. B., Wright; LI VOTI, Roberto. - In: ULTRASONICS. - ISSN 0041-624X. - STAMPA. - 50:(2010), pp. 197-201. [10.1016/j.ultras.2009.08.008]

Picosecond time scale imaging of mechanical contacts

LI VOTI, Roberto
Supervision
2010

Abstract

By means of an ultrafast opto-acoustic technique we study the nanoindentation of thin chromium films on sapphire substrates using a ceramic ball bearing. Acoustic pulses at 40 GHz returning from the film–indenter interface allow the film indentation profiles to be probed to sub-nanometer resolution over contact areas 25 lm in radius. The deformation of the films during loading is hereby revealed. Furthermore, thermal wave imaging of the contact at megahertz frequencies is simultaneously achieved.
2010
picosecond acoustics; nanoscale mechanical characterization; nanoscale thermal characterization
01 Pubblicazione su rivista::01a Articolo in rivista
Picosecond time scale imaging of mechanical contacts / T., Dehoux; O. B., Wright; LI VOTI, Roberto. - In: ULTRASONICS. - ISSN 0041-624X. - STAMPA. - 50:(2010), pp. 197-201. [10.1016/j.ultras.2009.08.008]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/128661
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