A phenomenological approach was used to obtain critical information about the structure and electrical properties of ultra thin Ba 0.05Sr 0.95TiO 3 (BSTO) layers over Nb electrodes. The method allows, in a simple way, to study and to optimize the growth of the barrier in order to improve the performance and application of Josephson junctions. A very good control of the layer thickness with a low roughness was achieved during the deposition process. The BSTO layers present an energy barrier of 0.6 eV and an attenuation length of 0.4 nm, indicating its good insulating properties for the development of Josephson junctions with improved performance. © 2012 American Institute of Physics.

Structural and transport characterization of ultra thin Ba 0.05Sr 0.95TiO 3 layers grown over Nb electrodes for the development of Josephson junctions / Sirena, M.; Aviles Felix, L.; Carvacho Vera, G. A.; Navarro Fernandez, H. L.; Steren, L. B.; Bernard, R.; Briatico, J.; Bergeal, N.; Lesueur, J.; Faini, G.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 100:1(2012). [10.1063/1.3675332]

Structural and transport characterization of ultra thin Ba 0.05Sr 0.95TiO 3 layers grown over Nb electrodes for the development of Josephson junctions

Carvacho Vera G. A.;
2012

Abstract

A phenomenological approach was used to obtain critical information about the structure and electrical properties of ultra thin Ba 0.05Sr 0.95TiO 3 (BSTO) layers over Nb electrodes. The method allows, in a simple way, to study and to optimize the growth of the barrier in order to improve the performance and application of Josephson junctions. A very good control of the layer thickness with a low roughness was achieved during the deposition process. The BSTO layers present an energy barrier of 0.6 eV and an attenuation length of 0.4 nm, indicating its good insulating properties for the development of Josephson junctions with improved performance. © 2012 American Institute of Physics.
2012
Josephson junctions, semiconductors
01 Pubblicazione su rivista::01a Articolo in rivista
Structural and transport characterization of ultra thin Ba 0.05Sr 0.95TiO 3 layers grown over Nb electrodes for the development of Josephson junctions / Sirena, M.; Aviles Felix, L.; Carvacho Vera, G. A.; Navarro Fernandez, H. L.; Steren, L. B.; Bernard, R.; Briatico, J.; Bergeal, N.; Lesueur, J.; Faini, G.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 100:1(2012). [10.1063/1.3675332]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1283767
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