To simulate long time and length scale processes involving DNA it is necessary to use a coarse-grained description. Here we provide an overview of different approaches to such coarse-graining, focussing on those at the nucleotide level that allow the self-assembly processes associated with DNA nanotechnology to be studied. OxDNA, our recently-developed coarse-grained DNA model, is particularly suited to this task, and has opened up this field to systematic study by simulations. We illustrate some of the range of DNA nanotechnology systems to which the model is being applied, as well as the insights it can provide into fundamental biophysical properties of DNA.

Coarse-graining DNA for simulations of DNA nanotechnology / Doye, Jonathan P K; Ouldridge, Thomas E; Louis, Ard A; Romano, Flavio; Šulc, Petr; Matek, Christian; Snodin, Benedict E K; Rovigatti, Lorenzo; Schreck, John S; Harrison, Ryan M; Smith, William P J. - In: PHYSICAL CHEMISTRY CHEMICAL PHYSICS. - ISSN 1463-9076. - 15:47(2013), p. 20395-414. [10.1039/c3cp53545b]

Coarse-graining DNA for simulations of DNA nanotechnology

Romano, Flavio;Rovigatti, Lorenzo;
2013

Abstract

To simulate long time and length scale processes involving DNA it is necessary to use a coarse-grained description. Here we provide an overview of different approaches to such coarse-graining, focussing on those at the nucleotide level that allow the self-assembly processes associated with DNA nanotechnology to be studied. OxDNA, our recently-developed coarse-grained DNA model, is particularly suited to this task, and has opened up this field to systematic study by simulations. We illustrate some of the range of DNA nanotechnology systems to which the model is being applied, as well as the insights it can provide into fundamental biophysical properties of DNA.
2013
Algorithms; DNA; Models, Molecular; Nanostructures; Nucleic Acid Conformation; Nanotechnology
01 Pubblicazione su rivista::01g Articolo di rassegna (Review)
Coarse-graining DNA for simulations of DNA nanotechnology / Doye, Jonathan P K; Ouldridge, Thomas E; Louis, Ard A; Romano, Flavio; Šulc, Petr; Matek, Christian; Snodin, Benedict E K; Rovigatti, Lorenzo; Schreck, John S; Harrison, Ryan M; Smith, William P J. - In: PHYSICAL CHEMISTRY CHEMICAL PHYSICS. - ISSN 1463-9076. - 15:47(2013), p. 20395-414. [10.1039/c3cp53545b]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1275988
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