The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.
Nanoscale thermoelastic probing of megahertz thermal diffusion / M., Tomoda; O. B., Wright; LI VOTI, Roberto. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 91:(2007), pp. 071911-1-071911-3. [10.1063/1.2770769]
Nanoscale thermoelastic probing of megahertz thermal diffusion
LI VOTI, Roberto
2007
Abstract
The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
