The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.

Nanoscale thermoelastic probing of megahertz thermal diffusion / M., Tomoda; O. B., Wright; LI VOTI, Roberto. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 91:(2007), pp. 071911-1-071911-3. [10.1063/1.2770769]

Nanoscale thermoelastic probing of megahertz thermal diffusion

LI VOTI, Roberto
2007

Abstract

The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.
2007
Atomic Force Microscopy; thermal diffusivity; thermoelasticity
01 Pubblicazione su rivista::01a Articolo in rivista
Nanoscale thermoelastic probing of megahertz thermal diffusion / M., Tomoda; O. B., Wright; LI VOTI, Roberto. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 91:(2007), pp. 071911-1-071911-3. [10.1063/1.2770769]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/126963
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