This study presents a comparison of the piezoelectric properties of nanostructured thin films made of arrays of vertically oriented ZnO-nanorods (ZnO-NRs) over ITO-glass substrate and of ZnO-nanowalls (ZnO-NWs) over aluminium substrate. Both nanostructures were synthesized on a large area through chemical bath deposition. The morphological, structural, and chemical characteristics of the produced nanostructures were investigated in order to assess the crystal quality and purity. To this purpose, we used different techniques, such as field-emission scanning electron microscopy, atomic force microscopy, energy dispersive x-ray analysis, powder x-ray diffraction, x-ray photoelectron spectroscopy, and photoluminescence spectroscopy. Moreover, the piezoelectric response of the nanostructured films was assessed through piezoresponse force microscopy. This technique was employed to obtain a quantitative evaluation of the piezoelectric coefficient (33of the film. We obtained33values as high as (7.01 ± 0.33) pm/V for ZnO-NRs and (2.63 ± 0.49) pm/V for ZnO-NWs films.

Piezoelectric thin films of ZnO-nanorods/nanowalls grown by chemical bath deposition / Fortunato, Marco; Chandraiahgari, Chandrakanth Reddy; De Bellis, Giovanni; Ballirano, Paolo; Soltani, Peiman; Kaciulis, Saulius; Caneve, Luisa; Sarto, Francesca; Sarto, Maria Sabrina. - In: IEEE TRANSACTIONS ON NANOTECHNOLOGY. - ISSN 1536-125X. - ELETTRONICO. - 17:2(2018), pp. 311-319. [10.1109/TNANO.2018.2800406]

Piezoelectric thin films of ZnO-nanorods/nanowalls grown by chemical bath deposition

Fortunato, Marco;Chandraiahgari, Chandrakanth Reddy;De Bellis, Giovanni;Ballirano, Paolo;Sarto, Maria Sabrina
2018

Abstract

This study presents a comparison of the piezoelectric properties of nanostructured thin films made of arrays of vertically oriented ZnO-nanorods (ZnO-NRs) over ITO-glass substrate and of ZnO-nanowalls (ZnO-NWs) over aluminium substrate. Both nanostructures were synthesized on a large area through chemical bath deposition. The morphological, structural, and chemical characteristics of the produced nanostructures were investigated in order to assess the crystal quality and purity. To this purpose, we used different techniques, such as field-emission scanning electron microscopy, atomic force microscopy, energy dispersive x-ray analysis, powder x-ray diffraction, x-ray photoelectron spectroscopy, and photoluminescence spectroscopy. Moreover, the piezoelectric response of the nanostructured films was assessed through piezoresponse force microscopy. This technique was employed to obtain a quantitative evaluation of the piezoelectric coefficient (33of the film. We obtained33values as high as (7.01 ± 0.33) pm/V for ZnO-NRs and (2.63 ± 0.49) pm/V for ZnO-NWs films.
2018
chemical bath deposition (CBD); piezoelectric coefficient (d33); piezoresponse force microscopy (PFM); ZnO nanorods (NRs); ZnO nanowalls (NWs); computer science applications; computer vision and pattern recognition; electrical and electronic engineering
01 Pubblicazione su rivista::01a Articolo in rivista
Piezoelectric thin films of ZnO-nanorods/nanowalls grown by chemical bath deposition / Fortunato, Marco; Chandraiahgari, Chandrakanth Reddy; De Bellis, Giovanni; Ballirano, Paolo; Soltani, Peiman; Kaciulis, Saulius; Caneve, Luisa; Sarto, Francesca; Sarto, Maria Sabrina. - In: IEEE TRANSACTIONS ON NANOTECHNOLOGY. - ISSN 1536-125X. - ELETTRONICO. - 17:2(2018), pp. 311-319. [10.1109/TNANO.2018.2800406]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1119574
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