We present wideband microwave measurements (1-22 GHz) taken on superconductor/ferromagnet heterostructures with the Corbino disc technique. We apply the technique to Nb/PdNi/Nb trilayers in the vortex state and we compare the results to data taken with the same technique on a Nb thin film. We show that it is possible to directly extract the genuine flux-flow resistivity from our frequency-dependent measurements without overcoming the (depinning) critical current. The characteristic frequency for vortex relaxation can also be estimated, without resorting to a specific model. We find that the F layer determines a weakening of pinning and an enhancement of the flux-flow resistivity with respect to the Nb film.

Wideband microwave measurements in Nb/Pd84Ni16/Nb structures and comparison with thin Nb films / E., Silva; N., Pompeo; Sarti, Stefano. - In: SUPERCONDUCTOR SCIENCE & TECHNOLOGY. - ISSN 0953-2048. - STAMPA. - 24:2(2011), p. 024018. [10.1088/0953-2048/24/2/024018]

Wideband microwave measurements in Nb/Pd84Ni16/Nb structures and comparison with thin Nb films

SARTI, Stefano
2011

Abstract

We present wideband microwave measurements (1-22 GHz) taken on superconductor/ferromagnet heterostructures with the Corbino disc technique. We apply the technique to Nb/PdNi/Nb trilayers in the vortex state and we compare the results to data taken with the same technique on a Nb thin film. We show that it is possible to directly extract the genuine flux-flow resistivity from our frequency-dependent measurements without overcoming the (depinning) critical current. The characteristic frequency for vortex relaxation can also be estimated, without resorting to a specific model. We find that the F layer determines a weakening of pinning and an enhancement of the flux-flow resistivity with respect to the Nb film.
2011
01 Pubblicazione su rivista::01a Articolo in rivista
Wideband microwave measurements in Nb/Pd84Ni16/Nb structures and comparison with thin Nb films / E., Silva; N., Pompeo; Sarti, Stefano. - In: SUPERCONDUCTOR SCIENCE & TECHNOLOGY. - ISSN 0953-2048. - STAMPA. - 24:2(2011), p. 024018. [10.1088/0953-2048/24/2/024018]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/105983
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