A new artificial material single layer (AMSL) model is presented to solve shielding problem. The field penetration through the conductive shield is described by lossy transmission line equations. The resulting equations are used to numerically synthetize an equivalent material for the shield region having the same geometrical configuration of the original shield, but different specific constants. The AMSL method is very accurate and highly efficient since it allows to discretizing the shield region using only a single layer of finite elements avoiding the fine discretization required by the finite-element method (FEM) to model the skin effect. The most relevant aspect of the proposed procedure is that the AMSL method can be easily implemented in FEM-based commercial software tools.

Artificial material single layer to model the field penetration through thin shields in finite-elements analysis / Feliziani, M.; Cruciani, S.; Campi, T.; Maradei, F.. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 66:1(2018), pp. 56-63. [10.1109/TMTT.2017.2737994]

Artificial material single layer to model the field penetration through thin shields in finite-elements analysis

S. Cruciani
Secondo
;
T. Campi
Penultimo
;
F. Maradei
Ultimo
2018

Abstract

A new artificial material single layer (AMSL) model is presented to solve shielding problem. The field penetration through the conductive shield is described by lossy transmission line equations. The resulting equations are used to numerically synthetize an equivalent material for the shield region having the same geometrical configuration of the original shield, but different specific constants. The AMSL method is very accurate and highly efficient since it allows to discretizing the shield region using only a single layer of finite elements avoiding the fine discretization required by the finite-element method (FEM) to model the skin effect. The most relevant aspect of the proposed procedure is that the AMSL method can be easily implemented in FEM-based commercial software tools.
2018
Artificial material single layer (AMSL); finite-element method (FEM); frequency domain techniques; impedance network boundary condition (INBC); shielding.; Radiation; Condensed Matter Physics; Electrical and Electronic Engineering
01 Pubblicazione su rivista::01a Articolo in rivista
Artificial material single layer to model the field penetration through thin shields in finite-elements analysis / Feliziani, M.; Cruciani, S.; Campi, T.; Maradei, F.. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 66:1(2018), pp. 56-63. [10.1109/TMTT.2017.2737994]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1024878
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