Energy-dispersive X-ray fluorescence (EDXRF) portable spectrometers are becoming very popular in many fields for the on-site analysis of elements. This is mainly because EDXRF is a nondestructive, multielemental technique that is extremely well suited for the analysis of any material. An EDXRF spectrometer mainly consists of an X- or γ -ray excitation source, an X-ray detector with electronics, and a pulseheight analyzer. Recent technological developments have resulted in small, low-power, dedicated X-ray tubes, thermoelectrically cooled semiconductor detectors, and small pulse-height analyzers. Therefore, completelyportable EDXRF spectrometers are available that can be assembled on-site, having the size of a book and a weight ranging from as light as 500 g (using a radioactive source) to a few kilograms (using an X-ray tube). This article start with a short introduction to X- ray physics than reviews the present status of the development of X-ray radiograpy, X-ray diffraction and EDXRF portable systems in the field of Cultural heritage. The various components of a portable system are described: the radiation source, i.e. small, low-power, dedicated X-ray tubes or, alternatively, radioactive sources that emit X-rays or low-energy γ -rays; and X-ray detectors, i.e. proportional gas counters and semiconductor detectors, with special emphasis on the more recent thermoelectrically cooled X- ray detectors: Si- PIN (silicon positive-intrinsic-negative), Si-drift, CdTe, CdZnTe, HgI2, and others. Commercial systems are considered, and finally the most common and significant applications are described, with particular emphasis to the field of works of art.
Study of Vatican Masterpices / S., Ridolfi; Gigante, Giovanni Ettore. - STAMPA. - 79(2013), pp. 288-295. [10.1007/978-3-642-30985-4].
Study of Vatican Masterpices
GIGANTE, Giovanni Ettore
2013
Abstract
Energy-dispersive X-ray fluorescence (EDXRF) portable spectrometers are becoming very popular in many fields for the on-site analysis of elements. This is mainly because EDXRF is a nondestructive, multielemental technique that is extremely well suited for the analysis of any material. An EDXRF spectrometer mainly consists of an X- or γ -ray excitation source, an X-ray detector with electronics, and a pulseheight analyzer. Recent technological developments have resulted in small, low-power, dedicated X-ray tubes, thermoelectrically cooled semiconductor detectors, and small pulse-height analyzers. Therefore, completelyportable EDXRF spectrometers are available that can be assembled on-site, having the size of a book and a weight ranging from as light as 500 g (using a radioactive source) to a few kilograms (using an X-ray tube). This article start with a short introduction to X- ray physics than reviews the present status of the development of X-ray radiograpy, X-ray diffraction and EDXRF portable systems in the field of Cultural heritage. The various components of a portable system are described: the radiation source, i.e. small, low-power, dedicated X-ray tubes or, alternatively, radioactive sources that emit X-rays or low-energy γ -rays; and X-ray detectors, i.e. proportional gas counters and semiconductor detectors, with special emphasis on the more recent thermoelectrically cooled X- ray detectors: Si- PIN (silicon positive-intrinsic-negative), Si-drift, CdTe, CdZnTe, HgI2, and others. Commercial systems are considered, and finally the most common and significant applications are described, with particular emphasis to the field of works of art.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.