A time-of-flight mass spectrometer has been used to study the dissociative double ionization of benzene by UV synchrotron radiation. The threshold energy for the main dissociative processes, leading to CH3 + + C5H3 +, C2H3 + + C4H3 + and C2H2 + + C4H4 + ion pairs have been characterized by exploiting a photoelectron-photoion-photoion-coincidence technique, giving 27.8 ± 0.1, 29.5 ± 0.1, and 30.2 ± 0.1 eV, respectively. Theoretical calculations of the energy and structure of dissociation product ions have been also performed to provide further information about the dynamics of these processes.
Dissociative double photoionization of benzene molecules in the 26-33 eV energy range / M., Alagia; P., Candori; S., Falcinelli; F., Pirani; M. S., Pedrosa Mundim; R., Richter; M., Rosi; Stranges, Stefano; F., Vecchiocattivi. - STAMPA. - (2011), pp. 18-19.
Dissociative double photoionization of benzene molecules in the 26-33 eV energy range
STRANGES, Stefano;
2011
Abstract
A time-of-flight mass spectrometer has been used to study the dissociative double ionization of benzene by UV synchrotron radiation. The threshold energy for the main dissociative processes, leading to CH3 + + C5H3 +, C2H3 + + C4H3 + and C2H2 + + C4H4 + ion pairs have been characterized by exploiting a photoelectron-photoion-photoion-coincidence technique, giving 27.8 ± 0.1, 29.5 ± 0.1, and 30.2 ± 0.1 eV, respectively. Theoretical calculations of the energy and structure of dissociation product ions have been also performed to provide further information about the dynamics of these processes.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
