FRAGOMENI, ERICA
FRAGOMENI, ERICA
DIPARTIMENTO DI SCIENZE DI BASE ED APPLICATE PER L'INGEGNERIA
Raman spectroscopy at 1550 nm. Resonant enhancement of two-phonon scattering in MoTe2 crystals
2026 Sotgiu, Simone; Venanzi, Tommaso; Nalabothula, Muralidhar; Stellino, Elena; Fragomeni, Erica; Nucara, Alessandro; Ortolani, Michele; Wirtz, Ludger; Baldassarre, Leonetta
Resonantly-enhanced Raman response in graphene-capped bismuthene on SiC
2026 Gehrig, Lukas; Schmitt, Cedric; Fragomeni, Erica; Sotgiu, Simone; Enzner, Stefan; Venanzi, Tommaso; Liu, Bing; Strauß, Kilian; Erhardt, Jonas; Kamp, Martin; Stellino, Elena; Postorino, Paolo; Schäfer, Jörg; Moser, Simon; Stampfer, Christoph; Sangiovanni, Giorgio; Claessen, Ralph; Baldassarre, Leonetta
Terahertz photoconductive atomic force microscopy of few-layer graphene flakes
2025 Fragomeni, E.; Berkmann, F.; Temperini, M. E.; Baldassarre, L.; Ortolani, M.; Giliberti, V.; Venanzi, T.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Raman spectroscopy at 1550 nm. Resonant enhancement of two-phonon scattering in MoTe2 crystals | 2026 | Sotgiu, Simone; Venanzi, Tommaso; Nalabothula, Muralidhar; Stellino, Elena; Fragomeni, Erica; Nucara, Alessandro; Ortolani, Michele; Wirtz, Ludger; Baldassarre, Leonetta | |
| Resonantly-enhanced Raman response in graphene-capped bismuthene on SiC | 2026 | Gehrig, Lukas; Schmitt, Cedric; Fragomeni, Erica; Sotgiu, Simone; Enzner, Stefan; Venanzi, Tommaso; Liu, Bing; Strauß, Kilian; Erhardt, Jonas; Kamp, Martin; Stellino, Elena; Postorino, Paolo; Schäfer, Jörg; Moser, Simon; Stampfer, Christoph; Sangiovanni, Giorgio; Claessen, Ralph; Baldassarre, Leonetta | |
| Terahertz photoconductive atomic force microscopy of few-layer graphene flakes | 2025 | Fragomeni, E.; Berkmann, F.; Temperini, M. E.; Baldassarre, L.; Ortolani, M.; Giliberti, V.; Venanzi, T. |