Application of XPS to the quantitative analysis of supported oxide catalysts is reviewed. Starting from the basic quantitative equations of XPS, the development of different models is summarized, including those for flat surfaces and rough profile surfaces, as well as models treating high surface area and porous materials. The significance of the approximations used in the various models is discussed, and the different approaches are compared. Examples from the literature are reported and critically evaluated to illustrate practical examples of application. (C) 1999 Elsevier Science B.V. All rights reserved.
XPS quantitative analysis and models of supported oxide catalysts / A., Cimino; Gazzoli, Delia; M., Valigi. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 104:1-3(1999), pp. 1-29. [10.1016/s0368-2048(98)00300-4]
XPS quantitative analysis and models of supported oxide catalysts
GAZZOLI, DELIA;
1999
Abstract
Application of XPS to the quantitative analysis of supported oxide catalysts is reviewed. Starting from the basic quantitative equations of XPS, the development of different models is summarized, including those for flat surfaces and rough profile surfaces, as well as models treating high surface area and porous materials. The significance of the approximations used in the various models is discussed, and the different approaches are compared. Examples from the literature are reported and critically evaluated to illustrate practical examples of application. (C) 1999 Elsevier Science B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
