Following the impact of a single femtosecond light pulse on nickel nanostripes, material deformations-or "nanobumps"- are created. We have studied the dependence of these nanobumps on the length of nanostripes and verified the link with plasmons. More specifically, local electric currents can melt the nanostructures in the hotspots, where hydrodynamic processes give rise to nanobumps. This process is further confirmed by independently simulating local magnetic fields, since these are produced by the same local electric currents. (C) 2013 Optical Society of America

Nanostripe length dependence of plasmon-induced material deformations / Ventsislav K., Valev; 1., Wim Libaers; Urs, Zywietz; Xuezhi, Zheng; Centini, Marco; Nils, Pfullmann; Lars O., Herrmann; Carsten, Reinhardt; Vladimir, Volskiy; Alejandro V., Silhanek; Sibilia, Concetta; A. E., Vandenbosch Guy; V., Moshchalkov Victor; Jeremy J., Baumberg; Verbiest, Thierry. - In: OPTICS LETTERS. - ISSN 0146-9592. - ELETTRONICO. - 38:13(2013), pp. 2256-2258. [10.1364/ol.38.002256]

Nanostripe length dependence of plasmon-induced material deformations

CENTINI, MARCO;SIBILIA, Concetta;
2013

Abstract

Following the impact of a single femtosecond light pulse on nickel nanostripes, material deformations-or "nanobumps"- are created. We have studied the dependence of these nanobumps on the length of nanostripes and verified the link with plasmons. More specifically, local electric currents can melt the nanostructures in the hotspots, where hydrodynamic processes give rise to nanobumps. This process is further confirmed by independently simulating local magnetic fields, since these are produced by the same local electric currents. (C) 2013 Optical Society of America
2013
palsmonics. metal; optics
01 Pubblicazione su rivista::01a Articolo in rivista
Nanostripe length dependence of plasmon-induced material deformations / Ventsislav K., Valev; 1., Wim Libaers; Urs, Zywietz; Xuezhi, Zheng; Centini, Marco; Nils, Pfullmann; Lars O., Herrmann; Carsten, Reinhardt; Vladimir, Volskiy; Alejandro V., Silhanek; Sibilia, Concetta; A. E., Vandenbosch Guy; V., Moshchalkov Victor; Jeremy J., Baumberg; Verbiest, Thierry. - In: OPTICS LETTERS. - ISSN 0146-9592. - ELETTRONICO. - 38:13(2013), pp. 2256-2258. [10.1364/ol.38.002256]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/517141
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