XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.
Cu/polyphenylacetylene Interface Investigated By Means of Xps / G., Polzonetti; Russo, Maria Vittoria; G., Iucci; A., Furlani. - In: SYNTHETIC METALS. - ISSN 0379-6779. - 55:(1993), pp. 165-170. [10.1016/0379-6779(93)90927-O]
Cu/polyphenylacetylene Interface Investigated By Means of Xps
RUSSO, Maria Vittoria;
1993
Abstract
XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 divided-by 13angstrom Cu. Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the pi ring electrons of the phenyl groups is evidenced by monitoring the changes occurring at the C 1s secondary structure pi-->pi* shake up transition.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
