Hemifacial microsomia: cephalometric evaluation [Microsomia emifacciale: valutazione cefalometrica.]

Among the facial deformities one of the most frequent is the hemifacial microsomia. The Authors after a revision of the literature refer about their study. They utilize lateral, antero-posterior cephalometry and orthopantomogram to exactly identify the deformities. The Authors report the results of the analysis and emphasize that the functional alterations of the stomatologic system are of basical importance in the genesis of the syndrome.