In this paper, a finite-difference time-domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method avoids the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to the analysis of ESD events in some configurations.

Analysis of upsets and failures due to ESD by the FDTD-INBCs method / Maradei, Francescaromana; M., Raugi. - In: IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS. - ISSN 0093-9994. - STAMPA. - 38:4(2002), pp. 1009-1017. (Intervento presentato al convegno Annual Meeting of the Industry-Applications-Society tenutosi a ROME, ITALY nel OCT 08-12, 2000) [10.1109/tia.2002.800775].

Analysis of upsets and failures due to ESD by the FDTD-INBCs method

MARADEI, Francescaromana;
2002

Abstract

In this paper, a finite-difference time-domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method avoids the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to the analysis of ESD events in some configurations.
2002
electrostatic discharge; finite-difference time-domain method; impedance network boundary conditions
01 Pubblicazione su rivista::01a Articolo in rivista
Analysis of upsets and failures due to ESD by the FDTD-INBCs method / Maradei, Francescaromana; M., Raugi. - In: IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS. - ISSN 0093-9994. - STAMPA. - 38:4(2002), pp. 1009-1017. (Intervento presentato al convegno Annual Meeting of the Industry-Applications-Society tenutosi a ROME, ITALY nel OCT 08-12, 2000) [10.1109/tia.2002.800775].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/45359
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