The surface electronic structure of the clean Si(100)-(2x1) surface at room temperature is studied by high-resolution electron-energy-loss spectroscopy. Main absorption edge is detected at similar to 0.4 eV, which corresponds to the energy gap of the system, further structures are singled out at 0.8 and 1.25 eV and ascribed to interband electronic transitions between dimer-related levels. The paramount importance of cleanness is addressed showing and quantifying the effect of the residual gas atmosphere (that can be present in ultrahigh vacuum) on the electronic structure.

Surface electronic structure at Si(100)-(2x1) / Luca, Gavioli; Betti, Maria Grazia; Antonio, Cricenti; Mariani, Carlo. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 76:(1995), pp. 541-545. (Intervento presentato al convegno 6th International Conference on Electron Spectroscopy (ICES 6) tenutosi a ROME, ITALY nel JUN 19-23, 1995) [10.1016/0368-2048(95)02466-2].

Surface electronic structure at Si(100)-(2x1)

BETTI, Maria Grazia;MARIANI, CARLO
1995

Abstract

The surface electronic structure of the clean Si(100)-(2x1) surface at room temperature is studied by high-resolution electron-energy-loss spectroscopy. Main absorption edge is detected at similar to 0.4 eV, which corresponds to the energy gap of the system, further structures are singled out at 0.8 and 1.25 eV and ascribed to interband electronic transitions between dimer-related levels. The paramount importance of cleanness is addressed showing and quantifying the effect of the residual gas atmosphere (that can be present in ultrahigh vacuum) on the electronic structure.
1995
01 Pubblicazione su rivista::01a Articolo in rivista
Surface electronic structure at Si(100)-(2x1) / Luca, Gavioli; Betti, Maria Grazia; Antonio, Cricenti; Mariani, Carlo. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 76:(1995), pp. 541-545. (Intervento presentato al convegno 6th International Conference on Electron Spectroscopy (ICES 6) tenutosi a ROME, ITALY nel JUN 19-23, 1995) [10.1016/0368-2048(95)02466-2].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/245710
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