We measure electronic and thermal nonlinear refractive indices of periodically nano-patterned and un-patterned siliconon-insulator (SOI) in comparison with that of bulk silicon, using a fast reflection Z-scan setup with a high-repetition-rate fs laser (at 800 nm wavelength), and a new procedure for discrimination between electronic and thermal nonlinearities. The electronic nonlinear response of nano-structured SOI is strongly enhanced in comparison with those of un-patterned SOI and of bulk Si. These results could be important in silicon photonics for optical devices with nonlinearity controlled by periodic nano-structuring.

Electronic and thermal nonlinear refractive indices of SOI and nano-patterned SOI measured by Z-scan method / A., Petris; F., Pettazzi; Fazio, Eugenio; C., Peroz; Y., Chen; V. I., Vlad; Bertolotti, Mario. - 6785:(2007), pp. 67850P-67856P. (Intervento presentato al convegno ROMOPTO 2006 tenutosi a SIBIU ROMANIA).

Electronic and thermal nonlinear refractive indices of SOI and nano-patterned SOI measured by Z-scan method

FAZIO, Eugenio;BERTOLOTTI, Mario
2007

Abstract

We measure electronic and thermal nonlinear refractive indices of periodically nano-patterned and un-patterned siliconon-insulator (SOI) in comparison with that of bulk silicon, using a fast reflection Z-scan setup with a high-repetition-rate fs laser (at 800 nm wavelength), and a new procedure for discrimination between electronic and thermal nonlinearities. The electronic nonlinear response of nano-structured SOI is strongly enhanced in comparison with those of un-patterned SOI and of bulk Si. These results could be important in silicon photonics for optical devices with nonlinearity controlled by periodic nano-structuring.
2007
ROMOPTO 2006
SOI; optical nonlinearity; photonics
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Electronic and thermal nonlinear refractive indices of SOI and nano-patterned SOI measured by Z-scan method / A., Petris; F., Pettazzi; Fazio, Eugenio; C., Peroz; Y., Chen; V. I., Vlad; Bertolotti, Mario. - 6785:(2007), pp. 67850P-67856P. (Intervento presentato al convegno ROMOPTO 2006 tenutosi a SIBIU ROMANIA).
File allegati a questo prodotto
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/236162
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 11
  • ???jsp.display-item.citation.isi??? 3
social impact