The paper deals with the modellization of complex discontinuities by passive lumped equivalent circuits. To this aim, an improved circuit extraction technique is proposed. The procedure is based on the approximation of the admittance/impedance parameters of the discontinuities derived by full-wave numerical simulations, in terms of rational functions suitable for the synthesis of high-order equivalent lumped circuits. The proposed extraction technique permits to derive directly feasible equivalent circuits which implicitly satisfy the passivity requirement.

Passive Equivalent Circuits of Complex Discontinuities: an Improved Extraction Technique / Araneo, Rodolfo; Maradei, Francescaromana. - STAMPA. - 3:(2005), pp. 700-704. (Intervento presentato al convegno IEEE International Symposium on Electromagnetic Compatibility tenutosi a CHICAGO nel August 8-12, 2005) [10.1109/ISEMC.2005.1513614].

Passive Equivalent Circuits of Complex Discontinuities: an Improved Extraction Technique

ARANEO, Rodolfo;MARADEI, Francescaromana
2005

Abstract

The paper deals with the modellization of complex discontinuities by passive lumped equivalent circuits. To this aim, an improved circuit extraction technique is proposed. The procedure is based on the approximation of the admittance/impedance parameters of the discontinuities derived by full-wave numerical simulations, in terms of rational functions suitable for the synthesis of high-order equivalent lumped circuits. The proposed extraction technique permits to derive directly feasible equivalent circuits which implicitly satisfy the passivity requirement.
2005
IEEE International Symposium on Electromagnetic Compatibility
EQUIVALENT CIRCUITS; MACROMODELLING
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Passive Equivalent Circuits of Complex Discontinuities: an Improved Extraction Technique / Araneo, Rodolfo; Maradei, Francescaromana. - STAMPA. - 3:(2005), pp. 700-704. (Intervento presentato al convegno IEEE International Symposium on Electromagnetic Compatibility tenutosi a CHICAGO nel August 8-12, 2005) [10.1109/ISEMC.2005.1513614].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/232257
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