The current approach to multi-scale modelling and simulation of advanced materials for EMC applications are discussed and presented. The critical issues related to the integration of modelling methods at different scales are addressed. Examples are given that illustrate the suggested approaches to predict the behavior and to influence the design of nanostructured materials for next generation nano-interconnects and frequency selective surfaces. © 2010 IEEE.

Modelling approaches for nanotechnology applied to electromagnetic compatibility / Sarto, Maria Sabrina; Tamburrano, Alessio. - STAMPA. - (2010), pp. 498-503. (Intervento presentato al convegno 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 tenutosi a Beijing nel 12 April 2010 through 16 April 2010) [10.1109/apemc.2010.5475668].

Modelling approaches for nanotechnology applied to electromagnetic compatibility

SARTO, Maria Sabrina;TAMBURRANO, Alessio
2010

Abstract

The current approach to multi-scale modelling and simulation of advanced materials for EMC applications are discussed and presented. The critical issues related to the integration of modelling methods at different scales are addressed. Examples are given that illustrate the suggested approaches to predict the behavior and to influence the design of nanostructured materials for next generation nano-interconnects and frequency selective surfaces. © 2010 IEEE.
2010
2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
electromagnetic modelling; nanointerconnects; nanomaterials; nanotechnology
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
Modelling approaches for nanotechnology applied to electromagnetic compatibility / Sarto, Maria Sabrina; Tamburrano, Alessio. - STAMPA. - (2010), pp. 498-503. (Intervento presentato al convegno 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 tenutosi a Beijing nel 12 April 2010 through 16 April 2010) [10.1109/apemc.2010.5475668].
File allegati a questo prodotto
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/225792
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 1
social impact